Cretu, B
Boudier, D
Simoen, E
Veloso, A
Collaert, N
Journal title: Semiconductor Science and Technology
Article type: paper
Article title: Assessment of DC and low-frequency noise performances of triple-gate FinFETs at cryogenic temperatures
Copyright information: © 2016 IOP Publishing Ltd
Publication dates
Date received: 2016-07-05
Date accepted: 2016-10-04
Online publication date: 2016-11-11