Eyben, P
Bisiaux, P
Schulze, A
Nazir, A
Vandervorst, W
Journal title: Nanotechnology
Article type: paper
Article title: Fast Fourier transform scanning spreading resistance microscopy: a novel technique to overcome the limitations of classical conductive AFM techniques
Copyright information: © 2015 IOP Publishing Ltd
Publication dates
Date received: 2015-04-30
Date accepted: 2015-07-13
Online publication date: 2015-08-06