Wirtz, T
Philipp, P
Audinot, J-N
Dowsett, D
Eswara, S
Funding for this research was provided by:
Fonds National de la Recherche Luxembourg (He-SIMS (C10/MS/801311))
Fonds National de la Recherche Luxembourg (LowZ-PIES (C13/MS/5951975))
Fonds National de la Recherche Luxembourg (PIES (C09/MS/13))
Fonds National de la Recherche Luxembourg (SIMS-SPM (FNR-MAT-08-01))
Intelligence Advanced Research Projects Activity (IARPA) (FA8650-11-C-7100)
Journal title: Nanotechnology
Article type: paper
Article title: High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy
Copyright information: © 2015 IOP Publishing Ltd
Publication dates
Date received: 2015-05-22
Date accepted: 2015-08-03
Online publication date: 2015-10-05