Kamas, Tuncay
Giurgiutiu, Victor
Lin, Bin
Funding for this research was provided by:
Directorate for Engineering (CMS-0925466)
Office of Naval Research (N00014-11-1-0271)
Journal title: Smart Materials and Structures
Article type: paper
Article title: Thickness mode EMIS of constrained proof-mass piezoelectric wafer active sensors
Copyright information: © 2015 IOP Publishing Ltd
Publication dates
Date received: 2015-07-01
Date accepted: 2015-08-26
Online publication date: 2015-10-22