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Comparison of four-probe thermal and thermoelectric transport measurements of thin films and nanostructures with microfabricated electro-thermal transducers

Crossref DOI link: https://doi.org/10.1088/1361-6463/aaa9d9

Published Online: 2018-02-15

Published Print: 2018-03-14

Update policy: https://doi.org/10.1088/crossmark-policy

Authors

Kim, Jaehyun https://orcid.org/0000-0002-7285-7148
Fleming, Evan

Zhou, Yuanyuan

Shi, Li https://orcid.org/0000-0002-5401-6839
Funding

Funding for this research was provided by:

Air Force Office of Scientific Research (FA9550-12-1-0037)

Office of Naval Research (N00014-16-1-2293)

Office of Naval Research (N00014-16-1-2436)

Defense Advanced Research Projects Agency (N66001-11-1-4107)
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Text and Data Mining valid from 2018-02-15

Version of Record valid from 2018-02-15
More Information

Journal title: Journal of Physics D: Applied Physics

Article type: rev

Article title: Comparison of four-probe thermal and thermoelectric transport measurements of thin films and nanostructures with microfabricated electro-thermal transducers

Copyright information: © 2018 IOP Publishing Ltd

Publication dates

Date received: 2017-12-05

Date accepted: 2018-01-23

Online publication date: 2018-02-15

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