Prakoso, Ari Bimo https://orcid.org/0000-0003-0287-9277
Lu, Chenjin
Rusli,
Cortecchia, Daniele
Soci, Cesare https://orcid.org/0000-0002-0149-9128
Berthe, Maxime
Deresmes, Dominique
Ayachi, Boubakeur
Vilcot, Jean-Pierre https://orcid.org/0000-0002-6448-4740
Diesinger, Heinrich https://orcid.org/0000-0002-6367-3419
Funding for this research was provided by:
French RENATECH network
The Singapore Ministry of Education (MOE2016-T1-1-164)
The Singapore National Research Foundation (NRF-CRP14-2014-03)
Journal title: Journal of Physics D: Applied Physics
Article type: paper
Article title: Voltage transient analysis as a generic tool for solar junction characterization
Copyright information: © 2018 IOP Publishing Ltd
Publication dates
Date received: 2018-03-28
Date accepted: 2018-07-10
Online publication date: 2018-07-27