Platier, B https://orcid.org/0000-0003-4524-0131
van de Wetering, F M J H https://orcid.org/0000-0002-0134-4468
van Ninhuijs, M A W https://orcid.org/0000-0002-0577-3403
Brussaard, G J H
Banine, V Y https://orcid.org/0000-0001-6676-7421
Luiten, O J https://orcid.org/0000-0003-2048-4455
Beckers, J https://orcid.org/0000-0001-6116-7013
Article Title: Addendum: Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy (2018 J. Phys: D. Appl. Phys. 52 034004)
Journal Title: Journal of Physics D: Applied Physics
Article Type: paper
Copyright Information: © 2020 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2020-03-31
Date Accepted: 2020-05-01
Online publication date: 2020-06-17