Rasel, Md Abu Jafar
Schoell, Ryan
Al-Mamun, Nahid Sultan
Hattar, Khalid
Harris, C Thomas https://orcid.org/0000-0003-4946-7181
Haque, Aman https://orcid.org/0000-0001-6535-5484
Wolfe, Douglas E
Ren, Fan
Pearton, Stephen J https://orcid.org/0000-0001-6498-1256
Funding for this research was provided by:
Center for Integrated Nanotechnologies
NSF (DMR 1856662)
US National Science Foundation (2015795)
Defense Threat Reduction Agency (HDTRA1-20-2-0002)
National Nuclear Security Administration (DE-NA-0003525)
Article Title: Heavy ion irradiation induced failure of gallium nitride high electron mobility transistors: effects of in-situ biasing
Journal Title: Journal of Physics D: Applied Physics
Article Type: paper
Copyright Information: © 2023 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2023-03-07
Date Accepted: 2023-04-24
Online publication date: 2023-05-09