Article Title: Physical understanding of a normally off p-GaN/AlGaN/GaN HEMT gate stack and a review of VTH measurement techniques
Journal Title: Journal of Physics D: Applied Physics
Article Type: paper
Copyright Information: © 2024 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2024-06-13
Date Accepted: 2024-09-26
Online publication date: 2024-10-15