Jeong, Chan Bae https://orcid.org/0000-0002-7892-8410
Kim, Dong Uk https://orcid.org/0000-0002-6124-9251
Han, Ilkyu https://orcid.org/0000-0002-5434-3039
Kim, Dongmok https://orcid.org/0000-0002-5291-9110
Hur, Hwan https://orcid.org/0000-0002-0854-9693
Kim, I Jong https://orcid.org/0000-0001-8158-8042
Lee, Kye-Sung https://orcid.org/0000-0001-8669-627X
Kim, Jung-Dae https://orcid.org/0000-0001-7939-2278
Choi, Woo June https://orcid.org/0000-0003-0793-2735
Chang, Ki Soo https://orcid.org/0000-0002-6067-2066
Funding for this research was provided by:
National Research Foundation of Korea (2021M3H4A6A03103722)
National Research Council of Science and Technology (GTL24041-000)
Korea Basic Science Institute (B437600)
Article Title: High-sensitive dual-mode thermoreflectance microscopy for the stationary and transient thermal analysis of microelectronic devices
Journal Title: Journal of Physics D: Applied Physics
Article Type: paper
Copyright Information: © 2024 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2024-09-13
Date Accepted: 2024-11-22
Online publication date: 2024-12-13