Wang, Zilan https://orcid.org/0000-0002-2741-5746
Li, Haoyang
Liu, Bo https://orcid.org/0009-0003-2597-4784
Yang, Jiapeng
Lin, Tianxiang https://orcid.org/0000-0002-5095-7746
Ling, Francis C C https://orcid.org/0000-0003-4757-1065
Wang, Lai https://orcid.org/0000-0001-7262-0020
Funding for this research was provided by:
Innovation and Technology Fund (ITS/359/23)
National Natural Science Foundation of China (62150027)
Guangdong Province Key Area Research Program (1933811500009)
National Key Research and Development Program (2021YFA0716400)
Article Title: Resolving emission rates from overlapping capacitance transients of deep levels in SiC
Journal Title: Journal of Physics D: Applied Physics
Article Type: paper
Copyright Information: © 2025 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2024-08-18
Date Accepted: 2024-12-12
Online publication date: 2025-01-06