Russell-Pavier, F S https://orcid.org/0000-0002-2150-6989
Picco, L https://orcid.org/0000-0002-3758-0972
Day, J C C https://orcid.org/0000-0002-1719-5065
Shatil, N R
Yacoot, A
Payton, O D https://orcid.org/0000-0003-4515-0603
Funding for this research was provided by:
Engineering and Physical Sciences Research Council (EPSRC) (1652638)
Journal title: Measurement Science and Technology
Article type: paper
Article title: ‘Hi-Fi AFM’: high-speed contact mode atomic force microscopy with optical pickups
Copyright information: © 2018 IOP Publishing Ltd
Publication dates
Date received: 2018-05-09
Date accepted: 2018-08-01
Online publication date: 2018-09-04