Funding for this research was provided by:
National Natural Science Foundation of China (51505404, 51675456)
Journal title: Measurement Science and Technology
Article type: paper
Article title: Enhancing the metrological performance of non-raster scanning probe microscopy using Gaussian process regression
Copyright information: © 2019 IOP Publishing Ltd
Publication dates
Date received: 2019-03-03
Date accepted: 2019-04-26
Online publication date: 2019-07-19