Morán-Meza, José A
Delvallée, Alexandra
Allal, Djamel
Piquemal, François https://orcid.org/0000-0002-7950-0475
Funding for this research was provided by:
EMPIR project ADVENT (16ENG06 ADVENT)
Article Title: A substitution method for nanoscale capacitance calibration using scanning microwave microscopy
Journal Title: Measurement Science and Technology
Article Type: paper
Copyright Information: © 2020 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2019-12-20
Date Accepted: 2020-03-24
Online publication date: 2020-04-30