Vachon, Frédéric https://orcid.org/0000-0002-6976-6624
Parent, Samuel
Nolet, Frédéric https://orcid.org/0000-0002-6750-7442
Dautet, Henri
Pratte, Jean-François https://orcid.org/0000-0002-8327-3842
Charlebois, Serge A https://orcid.org/0000-0001-7857-5056
Funding for this research was provided by:
Regroupement Stratégique en Microsystèmes du Québec
Fonds de Recherche du Québec - Nature et Technologies
CMC Microsystems
Natural Sciences and Engineering Research Council of Canada
Arthur B. McDonald Institute
Article Title: Measuring count rates free from correlated noise in digital silicon photomultipliers
Journal Title: Measurement Science and Technology
Article Type: paper
Copyright Information: © 2020 IOP Publishing Ltd
Publication dates
Date Received: 2020-05-23
Date Accepted: 2020-09-21
Online publication date: 2020-11-25