Wang, Wei
Lu, Xiangning https://orcid.org/0000-0002-2932-0185
He, Zhenzhi
Shi, Tielin https://orcid.org/0000-0001-6977-9700
Funding for this research was provided by:
National Natural Science Foundation of China (51675250)
Article Title: Using convolutional neural network for intelligent SAM inspection of flip chips
Journal Title: Measurement Science and Technology
Article Type: paper
Copyright Information: © 2021 IOP Publishing Ltd
Publication dates
Date Received: 2021-04-03
Date Accepted: 2021-07-20
Online publication date: 2021-08-13