Funding for this research was provided by:
Innovation Fund of Glasgow College, University of Electronic Science and Technology of China
Article Title: A class imbalanced wafer defect classification framework based on variational autoencoder generative adversarial network
Journal Title: Measurement Science and Technology
Article Type: paper
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Publication dates
Date Received: 2022-05-07
Date Accepted: 2022-10-31
Online publication date: 2022-11-18