Choudhary, Khilawan
Babu, Raja
Christie, Latha
Mahto, Manpuran https://orcid.org/0000-0002-0381-3790
Article Title: Real time conditioning monitoring of MOSFET using artificial neural network regression
Journal Title: Measurement Science and Technology
Article Type: paper
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Publication dates
Date Received: 2023-11-09
Date Accepted: 2024-05-14
Online publication date: 2024-05-22