Liu, Yuexuan https://orcid.org/0009-0003-6287-5312
Lian, Yudong https://orcid.org/0000-0002-8836-9093
Funding for this research was provided by:
Natural Science Foundation of Hebei Province (F2025202056)
Science and Technology Cooperation Special Project of Shijiazhuang (SJZZXC24003)
Article Title: An enhanced YOLOv11 model combined with dual-path scale network for high-accuracy PCB defect detection
Journal Title: Measurement Science and Technology
Article Type: paper
Copyright Information: © 2025 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2025-03-21
Date Accepted: 2025-08-14
Online publication date: 2025-08-29