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Microstructure and ferroelectricity of BaTiO<sub>3</sub> thin films on Si for integrated photonics

Crossref DOI link: https://doi.org/10.1088/1361-6528/aa53c2

Published Online: 2017-01-13

Published Print: 2017-02-17

Update policy: https://doi.org/10.1088/crossmark-policy

Authors

Kormondy, Kristy J https://orcid.org/0000-0002-1148-4915
Popoff, Youri

Sousa, Marilyne

Eltes, Felix

Caimi, Daniele

Rossell, Marta D

Fiebig, Manfred

Hoffmann, Patrik

Marchiori, Chiara

Reinke, Michael

Trassin, Morgan

Demkov, Alexander A

Fompeyrine, Jean

Abel, Stefan
Funding

Funding for this research was provided by:

Office of International Science and Engineering (1358111)

Horizon 2020 (H2020-ICT-2015-25-688579 PHRESCO)

Air Force Office of Scientific Research (FA9550-12-10494)

Air Force Office of Scientific Research (FA9550-14-1-0090)

Seventh Framework Programme (FP7-ICT-2013-11-619456-SITOGA)
License Information

Text and Data Mining valid from 2017-01-13

Version of Record valid from 2017-01-13

Accepted Manuscript valid from 2018-01-13
More Information

Journal title: Nanotechnology

Article type: paper

Article title: Microstructure and ferroelectricity of BaTiO3 thin films on Si for integrated photonics

Copyright information: © 2017 IOP Publishing Ltd

Publication dates

Date received: 2016-11-08

Date accepted: 2016-12-14

Online publication date: 2017-01-13