Fiorenza, Patrick https://orcid.org/0000-0002-9633-7892
Iucolano, Ferdinando
Nicotra, Giuseppe
Bongiorno, Corrado
Deretzis, Ioannis
La Magna, Antonino
Giannazzo, Filippo https://orcid.org/0000-0002-0074-0469
Saggio, Mario
Spinella, Corrado
Roccaforte, Fabrizio https://orcid.org/0000-0001-8632-0870
Funding for this research was provided by:
ECSEL JU (737483)
Journal title: Nanotechnology
Article type: paper
Article title: Electron trapping at SiO2/4H-SiC interface probed by transient capacitance measurements and atomic resolution chemical analysis
Copyright information: © 2018 IOP Publishing Ltd
Publication dates
Date received: 2018-01-30
Date accepted: 2018-07-04
Online publication date: 2018-07-18