Huang, Kailiang https://orcid.org/0000-0003-3573-1412
Zhao, Miao
Liu, Xueyuan
Xia, Qingzhen
Liu, Honggang
Funding for this research was provided by:
National Key Research and Development Program of China (2016YFA0201903, 2016YFA0202304)
General Program of National Natural Science Foundation of China (61504165, 61674168)
Opening Project of Key Laboratory of Microelectronics Devices and Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences (Y8YS01400)
Journal title: Nanotechnology
Article type: paper
Article title: Impacts of interface contaminations on the MoS2 field effect transistors and a modified fabrication process to pursue a better interface quality
Copyright information: © 2019 IOP Publishing Ltd
Publication dates
Date received: 2019-03-11
Date accepted: 2019-05-16
Online publication date: 2019-06-17