Chen, Yaoxu https://orcid.org/0000-0001-7100-8606
Wang, Huachun
Zhang, Yuan
Li, Rongfeng
Chen, Changhao
Zhang, Haitian
Tang, Shujun
Liu, Shengnan
Chen, Xian
Wu, Hui
Lv, Ruitao
Sheng, Xing
Zhang, Peijian
Wang, Shuodao
Funding for this research was provided by:
National Natural Science Foundation of China (51601103 (L.Y.))
1000 Youth Talents Program in China ((L.Y.))
National Science Foundation (Grant DMR-1905741)
Oklahoma Center for the Advancement of Science and Technology (HR18-085-1)
Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences (18ZS01)
Article Title: Electrochemically triggered degradation of silicon membranes for smart on-demand transient electronic devices
Journal Title: Nanotechnology
Article Type: paper
Copyright Information: © 2019 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2019-04-03
Date Accepted: 2019-06-10
Online publication date: 2019-07-15