Bu, Tianjia
Gao, Huifang
Yao, Yaxuan
Wang, Jianfeng
Pollard, Andrew J https://orcid.org/0000-0002-6841-2592
Legge, Elizabeth J
Clifford, Charles A
Delvallée, Alexandra https://orcid.org/0000-0002-8908-0742
Ducourtieux, Sébastien https://orcid.org/0000-0003-4427-433X
Lawn, Malcolm A
Babic, Bakir https://orcid.org/0000-0002-7869-1898
Coleman, Victoria A https://orcid.org/0000-0002-4630-3803
Jämting, Åsa
Zou, Shan
Chen, Maohui
Jakubek, Zygmunt J https://orcid.org/0000-0003-3307-8464
Iacob, Erica
Chanthawong, Narin
Mongkolsuttirat, KittiSun
Zeng, Guanghong
Almeida, Clara Muniz
He, Bo-Ching
Hyde, Lachlan
Ren, Lingling https://orcid.org/0000-0002-9804-7303
Funding for this research was provided by:
National Measurement System (NMS) of the Department for Business, Energy and Industrial Strategy (BEIS), UK (19NRM04 ISO-G-SCoPe)
Ministry of Science and Technology of the People’s Republic of China (NO. 2022YFF0608600 NO. 2016YFF0204300)
Article Title: Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison
Journal Title: Nanotechnology
Article Type: paper
Copyright Information: © 2023 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2022-10-09
Date Accepted: 2023-02-27
Online publication date: 2023-03-16