Sobolewski, Mark A https://orcid.org/0000-0001-7197-6471
Article Title: In situ measurement of electron emission yield at silicon dioxide surfaces exposed to argon plasmas
Journal Title: Plasma Sources Science and Technology
Article Type: paper
Copyright Information: © 2021 IOP Publishing Ltd
Publication dates
Date Received: 2020-10-15
Date Accepted: 2020-12-22
Online publication date: 2021-02-25