Gaillardin, Marc https://orcid.org/0000-0001-7290-1551
Marcandella, Claude
Martinez, Martial
Raine, Mélanie
Paillet, Philippe
Duhamel, Olivier
Richard, Nicolas
Journal title: Semiconductor Science and Technology
Article type: rev
Article title: Total ionizing dose effects in multiple-gate field-effect transistor
Copyright information: © 2017 IOP Publishing Ltd
Publication dates
Date received: 2016-10-28
Date accepted: 2017-04-07
Online publication date: 2017-07-03