Glaab, Johannes https://orcid.org/0000-0002-9252-8368
Ruschel, Jan
Mehnke, Frank
Lapeyrade, Mickael
Guttmann, Martin
Wernicke, Tim
Weyers, Markus
Einfeldt, Sven
Kneissl, Michael
Funding for this research was provided by:
Deutsche Forschungsgemeinschaft (SFB 787)
Bundesministerium für Bildung und Forschung (03ZZ0130A)
Article Title: Degradation behavior of AlGaN-based 233 nm deep-ultraviolet light emitting diodes
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2018 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2018-06-26
Date Accepted: 2018-08-01
Online publication date: 2018-08-20