Wolansky, Dirk https://orcid.org/0000-0002-4058-4886
Grabolla, Thomas
Lenke, Thomas
Schulze, Sebastian
Zaumseil, Peter
Journal title: Semiconductor Science and Technology
Article type: paper
Article title: Impact of nickel silicide on SiGe BiCMOS devices
Copyright information: © 2018 IOP Publishing Ltd
Publication dates
Date received: 2018-06-28
Date accepted: 2018-10-03
Online publication date: 2018-10-24