Elnaggar, Mohamed
Shaker, Ahmed https://orcid.org/0000-0001-6602-7343
Fedawy, Mostafa https://orcid.org/0000-0001-8556-1832
Article Title: A comprehensive investigation of TFETs with semiconducting silicide source: impact of gate drain underlap and interface traps
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2019 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2018-11-11
Date Accepted: 2019-02-21
Online publication date: 2019-03-20