Elnaggar, Mohamed
Shaker, Ahmed https://orcid.org/0000-0001-6602-7343
Fedawy, Mostafa https://orcid.org/0000-0001-8556-1832
Journal title: Semiconductor Science and Technology
Article type: paper
Article title: A comprehensive investigation of TFETs with semiconducting silicide source: impact of gate drain underlap and interface traps
Copyright information: © 2019 IOP Publishing Ltd
Publication dates
Date received: 2018-11-11
Date accepted: 2019-02-21
Online publication date: 2019-03-20