Beyne, Sofie https://orcid.org/0000-0002-5138-0280
Pedreira, Olalla Varela
Wolf, Ingrid De
Tőkei, Zsolt
Croes, Kristof
Funding for this research was provided by:
Fonds Wetenschappelijk Onderzoek (SB1S21616N)
Journal title: Semiconductor Science and Technology
Article type: paper
Article title: A novel electromigration characterization method based on low-frequency noise measurements
Copyright information: © 2019 IOP Publishing Ltd
Publication dates
Date received: 2019-01-25
Date accepted: 2019-04-15
Online publication date: 2019-06-06