Beyne, Sofie https://orcid.org/0000-0002-5138-0280
Pedreira, Olalla Varela
Wolf, Ingrid De
Tőkei, Zsolt
Croes, Kristof
Funding for this research was provided by:
Fonds Wetenschappelijk Onderzoek (SB1S21616N)
Article Title: A novel electromigration characterization method based on low-frequency noise measurements
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2019 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2019-01-25
Date Accepted: 2019-04-15
Online publication date: 2019-06-06