Barraud, S https://orcid.org/0000-0002-4334-9638
Previtali, B
Lapras, V
Coquand, R
Vizioz, C
Hartmann, J-M https://orcid.org/0000-0001-7006-8586
Cassé, M
Journal title: Semiconductor Science and Technology
Article type: paper
Article title: Top-down fabrication and electrical characterization of Si and SiGe nanowires for advanced CMOS technologies
Copyright information: © 2019 IOP Publishing Ltd
Publication dates
Date received: 2018-10-31
Date accepted: 2019-05-01
Online publication date: 2019-06-12