Trager-Cowan, C https://orcid.org/0000-0001-8684-7410
Alasmari, A
Avis, W
Bruckbauer, J https://orcid.org/0000-0001-9236-9320
Edwards, P R https://orcid.org/0000-0001-7671-7698
Ferenczi, G
Hourahine, B
Kotzai, A
Kraeusel, S
Kusch, G
Martin, R W https://orcid.org/0000-0002-6119-764X
McDermott, R
Naresh-Kumar, G
Nouf-Allehiani, M
Pascal, E
Thomson, D
Vespucci, S
Smith, M D
Parbrook, P J https://orcid.org/0000-0003-3287-512X
Enslin, J
Mehnke, F
Kuhn, C https://orcid.org/0000-0003-1735-6209
Wernicke, T
Kneissl, M
Hagedorn, S
Knauer, A
Walde, S
Weyers, M
Coulon, P-M
Shields, P A https://orcid.org/0000-0003-0517-132X
Bai, J https://orcid.org/0000-0002-6953-4698
Gong, Y
Jiu, L https://orcid.org/0000-0001-5014-297X
Zhang, Y
Smith, R M
Wang, T
Winkelmann, A
Funding for this research was provided by:
German Federal Ministry of Research and Education (Advanced UV for Life project consortium)
German Research Council (CRC 787 (Nanophotonics))
Engineering and Physical Sciences Research Council (EP/J015792/1)
Article Title: Structural and luminescence imaging and characterisation of semiconductors in the scanning electron microscope
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2020 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2019-09-02
Date Accepted: 2020-02-12
Online publication date: 2020-03-25