Stanchu, Hryhorii https://orcid.org/0000-0002-2987-1251
Kuchuk, Andrian V https://orcid.org/0000-0002-0571-6169
Mazur, Yuriy I
Margetis, Joe
Tolle, John
Richter, Jake
Yu, Shui-Qing
Salamo, Gregory J
Funding for this research was provided by:
Air Force Office of Scientific Research (FA9550-19-1-0341)
Article Title: X-ray diffraction study of strain relaxation, spontaneous compositional gradient, and dislocation density in GeSn/Ge/Si(100) heterostructures
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2020 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2020-02-02
Date Accepted: 2020-04-09
Online publication date: 2020-06-09