Melnichuk, O https://orcid.org/0000-0002-6768-8765
Melnichuk, L https://orcid.org/0000-0001-5524-5732
Venger, Ye https://orcid.org/0000-0003-1508-1627
Guillaume, C https://orcid.org/0000-0002-6732-1760
Chauvat, M-P
Portier, X https://orcid.org/0000-0002-5361-719X
Markevich, I https://orcid.org/0000-0001-8425-5198
Korsunska, N https://orcid.org/0000-0002-4778-5074
Khomenkova, L https://orcid.org/0000-0002-5267-5945
Funding for this research was provided by:
National Academy of Sciences of Ukraine (project III-4-10)
Ministry of Education and Science of Ukraine (project 89452)
French-Ukrainian Bilateral program DNIPRO (Project 37884WC, Project M/85-2018)
Journal title: Semiconductor Science and Technology
Article type: paper
Article title: Optical, structural and electrical characterization of pure ZnO films grown on p-type Si substrates by radiofrequency magnetron sputtering in different atmospheres
Copyright information: © 2020 IOP Publishing Ltd
Publication dates
Date received: 2020-01-19
Date accepted: 2020-05-15
Online publication date: 2020-08-13