Modolo, Nicola https://orcid.org/0000-0002-1549-1004
De Santi, Carlo https://orcid.org/0000-0001-6064-077X
Minetto, Andrea https://orcid.org/0000-0002-7893-3324
Sayadi, Luca
Sicre, Sebastien
Prechtl, Gerhard
Meneghesso, Gaudenzio https://orcid.org/0000-0002-6715-4827
Zanoni, Enrico https://orcid.org/0000-0001-7349-9656
Meneghini, Matteo https://orcid.org/0000-0003-2421-505X
Article Title: Understanding the effects of off-state and hard-switching stress in gallium nitride-based power transistors
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2020 IOP Publishing Ltd
Publication dates
Date Received: 2020-08-28
Date Accepted: 2020-10-23
Online publication date: 2020-11-12