Shao, Jingyan
Li, Xianglong https://orcid.org/0000-0003-4760-6715
Liu, Ziyu
Wang, Teng
Sun, Yabin https://orcid.org/0000-0002-3783-2885
Liu, Yun https://orcid.org/0000-0003-0744-6745
Li, Xiaojin https://orcid.org/0000-0002-9603-8489
Shi, Yanling
Funding for this research was provided by:
Science Foundation of Shanghai (19ZR1471300)
Science and Technology Commission of Shanghai Municipality (14DZ2260800.)
National Natural Science Foundation of China (61974056)
Shanghai Science and Technology Innovation Action Plan (19511131900)
Article Title: Evaluation of total-ionizing-dose effects on reconfigurable field effect transistors and SRAM circuits
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2021 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2021-01-25
Date Accepted: 2021-05-24
Online publication date: 2021-07-09