Lin, Yu-Shan
Chen, Yi-Lin https://orcid.org/0000-0002-6569-7270
Chang, Ting-Chang https://orcid.org/0000-0002-5301-6693
Ciou, Fong-Min
Zhu, Qing https://orcid.org/0000-0002-3929-7150
Tai, Mao‐Chou
Su, Wan-Ching
Kuo, Ting-Tzu
Chen, Kuan-Hsu
Zhu, Jie-Jie https://orcid.org/0000-0002-5436-2221
Mi, Min-Han https://orcid.org/0000-0003-4435-839X
Ma, Xiao-Hua https://orcid.org/0000-0002-1331-6253
Hao, Yue
Article Title: Investigating two-stage degradation of threshold voltage induced by off-state stress in AlGaN/GaN HEMTs
Journal Title: Semiconductor Science and Technology
Article Type: paper
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Publication dates
Date Received: 2021-10-21
Date Accepted: 2021-12-16
Online publication date: 2022-01-07