Baby, Rijo https://orcid.org/0000-0002-8754-0637
Venugopalrao, Anirudh
Chandrasekar, Hareesh https://orcid.org/0000-0001-7881-3739
Raghavan, Srinivasan
Rangarajan, Muralidharan
Nath, Digbijoy N
Funding for this research was provided by:
SERB (DSTO/DESE/MAS/1527)
ISRO
National Nano Fabrication Facility
Micro and Nano Characterization Facility
MSD Lab
Article Title: Study of the impact of interface traps associated with SiN X passivation on AlGaN/GaN MIS-HEMTs
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2022 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2021-10-08
Date Accepted: 2022-01-06
Online publication date: 2022-01-21