Valletta, Antonio https://orcid.org/0000-0002-3901-9230
Roccaforte, Fabrizio https://orcid.org/0000-0001-8632-0870
La Magna, Antonino https://orcid.org/0000-0002-4087-5210
Fortunato, Guglielmo
Fiorenza, Patrick https://orcid.org/0000-0002-9633-7892
Funding for this research was provided by:
ECSEL-JU (737483)
Article Title: Reliable evaluation method for interface state density and effective channel mobility in lateral 4H-SiC MOSFETs
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2022 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2022-03-08
Date Accepted: 2022-06-09
Online publication date: 2022-06-23