Yuan, Lifeng
Zhou, Feng https://orcid.org/0000-0002-3159-0328
Jin, Yulei
Yang, Qunsi https://orcid.org/0000-0002-5227-6258
Xu, Weizong
Ren, Fangfang
Zhou, Dong
Chen, Dunjun https://orcid.org/0000-0002-1363-1413
Zhang, Rong
Zheng, Youdou
Lu, Hai
Funding for this research was provided by:
National Natural Science Foundation of China (61921005)
Article Title: Third quadrant overvoltage ruggedness of p-gate GaN HEMTs
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2022 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2022-04-21
Date Accepted: 2022-07-27
Online publication date: 2022-08-04