Shaik, Rameez Raja https://orcid.org/0000-0002-5771-1896
Pradhan, K P https://orcid.org/0000-0002-7313-294X
Funding for this research was provided by:
Science and Engineering Research Board (SRG/2020/001622)
Article Title: Investigation on performance degradation due to induced interface trapped charges on HSO based FDSOI NCFET and sustaining it through back-gate bias
Journal Title: Semiconductor Science and Technology
Article Type: paper
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Publication dates
Date Received: 2022-05-15
Date Accepted: 2022-09-02
Online publication date: 2022-09-15