Kim, Kyoungdu
Kim, Hae-In
Lee, Taehun
Lee, Won-Yong
Bae, Jin-Hyuk https://orcid.org/0000-0003-3217-1309
Kang, In Man https://orcid.org/0000-0002-7726-9740
Lee, Sin-Hyung https://orcid.org/0000-0002-8723-439X
Kim, Kwangeun
Jang, Jaewon https://orcid.org/0000-0003-1908-0015
Funding for this research was provided by:
National Research Foundation of Korea (2021M3F3A2A03017764)
Article Title: Thickness dependence of resistive switching characteristics of the sol–gel processed Y2O3 RRAM devices
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2023 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2022-09-08
Date Accepted: 2023-02-13
Online publication date: 2023-02-23