Mao, Weiwei
Cui, Can https://orcid.org/0000-0002-8429-5875
Xiong, Huifan
Zhang, Naifu https://orcid.org/0000-0003-4137-3236
Liu, Shuai
Dou, Maofeng
Song, Lihui https://orcid.org/0000-0001-5536-8388
Yang, Deren
Pi, Xiaodong https://orcid.org/0000-0002-4233-6181
Funding for this research was provided by:
“Pioneer” and “Leading Goose” R&D Program of Zhejiang (2022C01021)
Article Title: Surface defects in 4H-SiC: properties, characterizations and passivation schemes
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2023 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2022-12-05
Date Accepted: 2023-05-12
Online publication date: 2023-06-08