Liang, Hailian https://orcid.org/0000-0001-9587-5464
Li, Liping
Liu, Junliang https://orcid.org/0000-0002-1313-5073
Lin, Feng
Xu, Chaoqi
Sun, Jun
Gu, Xiaofeng
Article Title: Investigating the trade-off between BV stability and ESD robustness in the n-channel LDMOS devices
Journal Title: Semiconductor Science and Technology
Article Type: paper
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Publication dates
Date Received: 2024-07-04
Date Accepted: 2024-09-26
Online publication date: 2024-10-04