Xu, Chi https://orcid.org/0000-0002-3374-1580
Wu, Zhengjie
Li, Yue
Wang, Xiaoyu
Chang, Xiyan
Xie, Changjiang
Wang, Caile
Chen, Chen
Wang, Yixin
Cong, Hui
Xue, Chunlai https://orcid.org/0000-0001-7816-1873
Funding for this research was provided by:
Key Research Program of Frontier Sciences, CAS (ZDBS-LY-JSC008)
Research and Development Program of China (2021YFB2206503)
National Natural Science Foundation of China (62125405)
CAS Project for Young Scientists in Basic Research (YSBR-056)
Youth Innovation Promotion Association of Chinese Academy of Sciences (2023122)
Article Title: Elucidating a proper framework for the determination of threading dislocation densities in semiconductor films: a comprehensive study based on Ge/Si(001)
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2024 The Author(s). Published by IOP Publishing Ltd
Publication dates
Date Received: 2024-08-07
Date Accepted: 2024-10-23
Online publication date: 2024-11-08