Chen, Feilian
Wan, Yunhao
Balasubramanian, Paramasivam
Zhang, Meng https://orcid.org/0000-0002-9302-4057
Article Title: Influence of radio-frequency magnetron sputtering power on electrical characteristics and positive bias stress stability of indium tin zinc oxide thin-film transistors
Journal Title: Semiconductor Science and Technology
Article Type: paper
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Publication dates
Date Received: 2024-09-01
Date Accepted: 2024-12-02
Online publication date: 2024-12-11