Chen, Yipeng https://orcid.org/0000-0001-8976-4952
Zhang, Ling https://orcid.org/0000-0001-8206-3408
Zhu, Xinyu
Jiang, Yunhao
Xu, Zhencheng
Gao, Zhiliang
Cheng, Qianding
Zhou, Li
Dong, Shurong https://orcid.org/0000-0002-8715-7072
Funding for this research was provided by:
Electrostatic Research Foundation of Liu Shanghe Academicians and Experts Workstation (2022R52042)
NSFC-Zhejiang Joint Fund for the Integration of Industrialization and information (U20A20172)
Joint Project of Yangtze River Delta Community of Sei-Tech Innovation (2022CSJGG0402)
Article Title: Electrostatic discharge failure and protection of single-walled carbon nanotube field-effect transistors
Journal Title: Semiconductor Science and Technology
Article Type: paper
Copyright Information: © 2025 IOP Publishing Ltd. All rights, including for text and data mining, AI training, and similar technologies, are reserved.
Publication dates
Date Received: 2024-08-27
Date Accepted: 2024-12-31
Online publication date: 2025-01-10