Bagrets, N https://orcid.org/0000-0003-0323-4972
Anvar, V A https://orcid.org/0000-0003-1264-6442
Chiesa, L https://orcid.org/0000-0002-8783-2031
Delgado, M A
McRae, D M
Nijhuis, A https://orcid.org/0000-0002-1600-9451
Nishijima, G https://orcid.org/0000-0001-7493-0559
Osamura, K https://orcid.org/0000-0002-6401-7237
Shin, H S https://orcid.org/0000-0002-4922-2427
Walsh, R P https://orcid.org/0000-0002-1747-8946
Weiss, K-P https://orcid.org/0000-0002-7504-4505
Zhang, Y https://orcid.org/0000-0001-9523-4878
Zhao, Y https://orcid.org/0000-0002-7231-2156
Zhao, Z
Journal title: Superconductor Science and Technology
Article type: paper
Article title: International round robin test for tensile testing HTS wires at cryogenic temperatures
Copyright information: © 2019 IOP Publishing Ltd
Publication dates
Date received: 2018-10-07
Date accepted: 2018-12-04
Online publication date: 2019-01-16