Davtyan, Arman
Biermanns, Andreas
Loffeld, Otmar
Pietsch, Ullrich
Funding for this research was provided by:
Faculty of Science and Engineering of the University of Siegen
Journal title: New Journal of Physics
Article type: paper
Article title: Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging
Copyright information: © 2016 IOP Publishing Ltd and Deutsche Physikalische Gesellschaft
License information: cc-by Original content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Publication dates
Date received: 2015-05-28
Date accepted: 2016-05-11
Online publication date: 2016-06-20