Carignan-Dugas, Arnaud http://orcid.org/0000-0002-2036-2688
Boone, Kristine
Wallman, Joel J http://orcid.org/0000-0001-6943-5334
Emerson, Joseph
Funding for this research was provided by:
Natural Sciences and Engineering Research Council of Canada (PGS D)
Industry Canada
Canadian Institute for Advanced Research
Canada First Research Excellence Fund
Army Research Office (W911NF-14-1-0103)
Journal title: New Journal of Physics
Article type: lett
Article title: From randomized benchmarking experiments to gate-set circuit fidelity: how to interpret randomized benchmarking decay parameters
Copyright information: © 2018 The Author(s). Published by IOP Publishing Ltd on behalf of Deutsche Physikalische Gesellschaft
License information: cc-by Original content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
Publication dates
Date received: 2018-04-20
Date accepted: 2018-08-24
Online publication date: 2018-09-05